The competition is over! However, this service is still active to give people an opportunity to download datasets and try themselves.
Details of the competition may be found in the paper:
[First Eye Movement Verification and Identification Competition at
BTAS 2012]
You may be also interested in the next edition of the competition:
[The Second Eye Movement Verification and Identification Competition (EMVIC)]
You can also learn more about Eye Movement Biometrics on our [web page].
The aim of the contest is to determine how people may be identified based on their eye movement characteristic. The organizers will provide all interested participants four datasets of eye movements' recordings in a extremely simple EMD formats. After downloading the datasets, participants may analyze it to prepare their own classification models. See competition formula for details.
This in an official competition for BTAS 2012 (The Fifth IEEE International Conference on Biometrics: Theory, Applications and Systems, September 23-27, Washington DC, USA) and all results will be published during that conference (and of course on this web page as well).
To become a participant you don't need to have any special eye tracking equipment. All data needed is ready to download! You only need to have some experience in data classification and... take your chance.
However, it is sometimes good to see what others have done in this field. On this page you may find some information about biometric identification and about eye movements in biometrics.
Deadline is 15 April 2012 22 April 2012 (
)
We are already here:
Dr Pawel Kasprowski, Silesian University of Technology, Poland
Dr Oleg Komogortsev, Texas State University-San Marcos, USA
Dr Alex Karpov, Texas State University-San Marcos, USA
Dr Adrian Kapczynski, Silesian University of Technology, Poland
Competition co-chairs on behalf of BTAS conference:
Dr Raffaele Cappelli, Univerity of Bologna, Italy
Dr Karl Ricanek, University of North Carolina Wilmington, USA
Dr Elham Tabassi, National Institute of Standards and Technology, USA